- Series:
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- Type:
-
- Contact Material:
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- Electus conditionibus;
Odonata Lepidoptera products 12
Image | part | manufacturer | quantitas | partus tempus | Unit Price | buy | Description | Series | Type | Contact Material | ||
---|---|---|---|---|---|---|---|---|---|---|---|---|
Image | part | manufacturer | quantitas | partus tempus | Unit Price | buy | Description | Series | Type | Contact Material | ||
Pomona Electronics |
111
|
III dies |
-
|
MOQ: 1 MPQ: 1
|
TEST CLIP 16PIN SOIC
|
SOIC Clip | SOIC,0.15 to 0.35" Wide | - | ||||
3M |
59
|
III dies |
-
|
MOQ: 1 MPQ: 1
|
16 PIN TEST CLIP .3 ROW SPACE
|
923 | DIP,.300" | Copper Alloy | ||||
3M |
60
|
III dies |
-
|
MOQ: 1 MPQ: 1
|
16-PIN TEST CLIP ALLOY DIP .30"
|
923 | DIP,.300" | Copper Alloy | ||||
3M |
24
|
III dies |
-
|
MOQ: 1 MPQ: 1
|
16-PIN TEST CLIP GOLD SOIC .15"
|
923 | SOIC,0.15" to 0.30" Wide | Copper Alloy | ||||
3M |
45
|
III dies |
-
|
MOQ: 1 MPQ: 1
|
16-PIN TEST CLIP GOLD DIP .30"
|
923 | DIP,.300" | Copper Alloy | ||||
3M |
32
|
III dies |
-
|
MOQ: 1 MPQ: 1
|
16-PIN TEST CLIP GOLD SOIC .30"
|
923 | SOIC,0.30" Body | Copper Alloy | ||||
3M |
24
|
III dies |
-
|
MOQ: 1 MPQ: 1
|
16-PIN TEST CLIP GOLD DIP .30"
|
923 | DIP,.300" | Copper Alloy | ||||
3M |
3
|
III dies |
-
|
MOQ: 1 MPQ: 1
|
TEST CLIP 16POS DIP KNIFE EDGE.3
|
927 | DIP,0.3" Row Spacing | Copper Alloy | ||||
3M |
Quaestiones
|
- |
-
|
MOQ: 1 MPQ: 1
|
16 PIN TEST CLIP .5/.6 ROW SPACE
|
923 | DIP,.300" | Copper Alloy | ||||
3M |
Quaestiones
|
- |
-
|
MOQ: 1 MPQ: 1
|
16-PIN TEST CLIP ALLOY DIP .60"
|
923 | DIP,.600" | Copper Alloy | ||||
Pomona Electronics |
Quaestiones
|
- |
-
|
MOQ: 1 MPQ: 1
|
DIP TEST CLIP 16PIN CLOSED GOLD
|
DIP Clip | DIP,Standard | Beryllium Copper | ||||
Pomona Electronics |
Quaestiones
|
- |
-
|
MOQ: 1 MPQ: 1
|
DIP TEST CLIP 16PIN OPEN GOLD
|
DIP Clip | DIP,Open Back | Beryllium Copper |